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Philippines Semiconductor and Electronics Convention and Exhibition (PSECE) 2016

PSECE 2016

Event Details

Date:15-17 June 2016
Time: 08:00-18:00
Booth Number: 106 & 107
Venue: SMX Convention Center, Pasay City

Join National Instruments at the upcoming PSECE 2016 Tradeshow to experience the latest semiconductor test technologies that have been adopted in hundreds of semiconductor design and manufacturing test applications worldwide. Talk to our experts at the booth to learn how to lower your cost of test, accelerate time to market and discover how to meet the next-generation test requirements


What you can expect at PSECE 2016:

Lower the Total Cost of Ownership with the Semiconductor Test Systems
Date: 15 June 2016
Venue: Area 2
Time: 11:30am – 12:00pm
Speaker: Neo Wei Ren, Business Development Manager


This session will introduce new features in the NI Semiconductor Test System that are used for production test cell integration. We will then share tools and insights that help you model the total cost of test for semiconductor devices. As a result of attending, you will be better equipped to calculate how much you’re actually spending on test, and identify ways to reduce your test cost. In addition, you will also be better prepared to develop and deliver this insight and data internally within your organization.


NI Semiconductor Test Systems
The Semiconductor Test System (STS) series features fully production-ready test systems that use NI technology in a form factor suitable for a semiconductor production test environment. The STS combines the NI PXI platform, TestStand test management software, and LabVIEW graphical programming inside a fully enclosed test head. Its “tester in a head” design houses all the key components of a production tester including system controllers; DC, AC, and RF instrumentation; device under test (DUT) interfacing; and device handler/prober docking mechanics. This compact design eliminates the extra floor space, power, and maintenance required by traditional ATE testers that unnecessarily increase the cost of test.


Submit your details here and collect your NI gift at our booth:

Contact Information


Additional Resources:

 Know more about NI Semiconductor Test System

IDT Lowers Cost of Test by Adopting the NI Semiconductor Test System


For more information of the tradeshow, please visit

·         DC Converter Testing with NI SMU