Date:15-17 June 2016
Join National Instruments at the upcoming PSECE 2016 Tradeshow to experience the latest semiconductor test technologies that have been adopted in hundreds of semiconductor design and manufacturing test applications worldwide. Talk to our experts at the booth to learn how to lower your cost of test, accelerate time to market and discover how to meet the next-generation test requirements
What you can expect at PSECE 2016:
Lower the Total Cost of Ownership with the Semiconductor Test Systems
This session will introduce new features in the NI Semiconductor Test System that are used for production test cell integration. We will then share tools and insights that help you model the total cost of test for semiconductor devices. As a result of attending, you will be better equipped to calculate how much you’re actually spending on test, and identify ways to reduce your test cost. In addition, you will also be better prepared to develop and deliver this insight and data internally within your organization.
NI Semiconductor Test Systems
Submit your details here and collect your NI gift at our booth:
For more information of the tradeshow, please visit http://www.seipi.org.ph/meetings/psece/