Date: 3-5 June 2015
Booth Number: 181 (Singapore Pavilion)
Venue: World Trade Center Metro Manila
Join National Instruments at the upcoming PSECE 2015 Tradeshow to experience the latest semiconductor test technologies that have been adopted in hundreds of semiconductor design and manufacturing test applications worldwide. Talk to our experts at the booth to learn how to lower your cost of test, accelerate time to market and discover how to meet the next-generation test requirements
What you can expect at PSECE 2015:
Evolving Approaches for Semiconductor ATE: A Hybrid Approach with COT Platforms
Date: 3 June 2015
Time: 11:00am – 11:30am
Presenter : Jack Aguilar, Area Sales Manager
With smart phones, tablets and the internet of things, semiconductor devices have a tremendously increased amount of analog and RF content. For these devices, the traditional ATE does not scale well. These ICs tend to have fast technology cycles and consequently test requirements tend to change often. When the test requirements change, it is usually difficult to build upon the initial investment to grow the capability due to the proprietary or closed architecture of ATE.
The NI Semiconductor Test System (NI STS) is an open architecture that provides the ability to grow test system capabilities, thus addressing the challenges of the changes in test requirements. It is a hybrid approach that takes advantage of commercial-off-the-shelf (COT) platforms. This approach combines the cost effective, small footprint, high performance COT instrumentation with powerful software, docking and interfacing mechanics to deliver high throughput, serviceability and overall production-worthiness of traditional ATE. Since this approach is based on already established industry standard platform, it is designed to cope with changing requirements. In other words, this approach provides the ability grow the test system capability by taking advantage of rapid growing COT PXI instrumentation.
NI Semiconductor Test Systems
The Semiconductor Test System (STS) series features fully production-ready test systems that use NI technology in a form factor suitable for a semiconductor production test environment. The STS combines the NI PXI platform, TestStand test management software, and LabVIEW graphical programming inside a fully enclosed test head. Its “tester in a head” design houses all the key components of a production tester including system controllers; DC, AC, and RF instrumentation; device under test (DUT) interfacing; and device handler/prober docking mechanics. This compact design eliminates the extra floor space, power, and maintenance required by traditional ATE testers that unnecessarily increase the cost of test.
DC Converter Testing with NI SMU
This demo shows off key features of NI SMUs by characterizing two DC-DC converters and high-brightness LEDs. The key features of this demo are the wide IV boundary, high sampling rate, and tight synchronization. The wide IV boundary allows us to use the 4139 for the high voltage requirements, as well as a sink high current into the 4139 on the output of the PMIC. The high sampling rate allows us to use the 4139 as a high voltage or current oscilloscope for capturing line and load transients.